Chao, Yu-Faye : rechercher sur Z-Library

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1

Ultra fast self-corrected polarization modulated ellipsometer

Hsiu-Ming Tsai, Leng-Chun Chen, Yu-Faye Chao

Journal:

Thin Solid Films

Année:

2011

Langue:

english

Fichier:

PDF, 321 KB

english, 2011

2

Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate–lead titanate single crystal

Chun-I Chuang, Vera Marinova, Shiuan-Huei Lin, Yu-Faye Chao

Journal:

Thin Solid Films

Année:

2011

Langue:

english

Fichier:

PDF, 266 KB

english, 2011

3

Volume polarization holographic recording in thick phenanthrenequinone-doped poly(methyl methacrylate) photopolymer

Lin, Shiuan Huei, Chen, Po-Lin, Chuang, Chun-I, Chao, Yu-Faye, Hsu, Ken Y.

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 492 KB

english, 2011

4

Photoelastic modulated imaging ellipsometry by stroboscopic illumination technique

Han, Chien-Yuan, Chao, Yu-Faye

Journal:

Review of Scientific Instruments

Année:

2006

Langue:

english

Fichier:

PDF, 715 KB

english, 2006

5

Assessment of interface roughness during plasma etching through the use of real-time ellipsometry

Chien-Yuan Han, Chien-Wen Lai, Yu-Faye Chao, Ke-Ciang Leou, Tsang-Lang Lin

Journal:

Applied Surface Science

Année:

2011

Langue:

english

Fichier:

PDF, 510 KB

english, 2011

6

Real-time measurement of photo-induced effects in 9,10-phenanthrenequinone-doped poly(methyl methacrylate) photopolymer by phase-modulated ellipsometry

Chun-I. Chuang, Yi-Nan Hsiao, Shiuan-Huei Lin, Yu-Faye Chao

Journal:

Optics Communications

Année:

2010

Langue:

english

Fichier:

PDF, 355 KB

english, 2010

7

Post flight analysis of the surface plasmon resonance enhanced photoelastic modulated ellipsometry

Yu-Faye Chao, Chien-Yuan Han

Journal:

Sensors and Actuators B: Chemical

Année:

2007

Langue:

english

Fichier:

PDF, 316 KB

english, 2007

8

Determination of optical parameters of a twisted-nematic liquid crystal by phase-sensitive optical heterodyne interferometric ellipsometry

Tsai, Chien-Chung, Chou, Chien, Han, Chien-Yuan, Hsieh, Cheng-Hung, Liao, Kuo-Yu, Chao, Yu-Faye

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 505 KB

english, 2005

9

Determining thickness of films on a curved substrate by use of ellipsometric measurements

Han, Chien-Yuan, Lee, Zhen-You, Chao, Yu-Faye

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 621 KB

english, 2009

10

Optimization of a four-temporal phase lock for photoelastic-modulated polarimetry

Tsai, Hsiu-Ming, Chao, Yu-Faye

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 227 KB

english, 2009

11

Dynamic characterization of photo-alignment of azo-dye-doped polymer using phase modulated polarimetry

Chuang, Chun-I, Lin, Shiuan-Huei, Chao, Yu-Faye

Journal:

Optical Materials

Année:

2013

Langue:

english

Fichier:

PDF, 676 KB

english, 2013

12

Rapid and accurate extraction of optical parameters for uniaxial bulk media by phase modulated ellipsometry

Chuang, Chun-I, Lin, Shiuan-Huei, Chao, Yu-Faye

Journal:

Optics and Lasers in Engineering

Année:

2013

Langue:

english

Fichier:

PDF, 618 KB

english, 2013

13

[OSA Frontiers in Optics - Rochester, New York (2006..-..)] Frontiers in Optics - Photoelastic Modulated Imaging Ellipsometry in Surface Plasmon Resonance Detection

Chao, Yu-Faye, Tsai, Hsiu-Ming, Han, Chien-Yuan

Année:

2006

Langue:

english

Fichier:

PDF, 394 KB

english, 2006

14

Calibrations of Phase Modulation Amplitude of Photoelastic Modulator

Wang, Meng-Wei, Chao, Yu-Faye, Leou, Keh-Chyang, Tsai, Fei-Hsin, Lin, Tsang-Lang, Chen, Shu-Shien, Liu, Yu-Wei

Journal:

Japanese Journal of Applied Physics

Année:

2004

Langue:

english

Fichier:

PDF, 267 KB

english, 2004

15

Measurement of Optical Activity using a Photoelastic Modulator System

Wang, Charn-Kuo, Chao, Yu-Faye

Journal:

Japanese Journal of Applied Physics

Année:

1999

Langue:

english

Fichier:

PDF, 280 KB

english, 1999

16

A Direct Determination Technique for Azimuth Alignment in Photoelastic Modulation Ellipsometry

Chao, Yu-Faye, Wang, Charn-Kuo, Liu, Shing

Journal:

Japanese Journal of Applied Physics

Année:

1999

Langue:

english

Fichier:

PDF, 119 KB

english, 1999

17

SPIE Proceedings [SPIE Hague International Symposium - The Hague, Netherlands (Monday 30 March 1987)] Inverse Problems in Optics - Mie Scattering Calculation And Continued Fraction

Chao, Yu-Faye, Pike, Edward R.

Année:

1987

Langue:

english

Fichier:

PDF, 157 KB

english, 1987

18

SPIE Proceedings [SPIE International Symposium on Photonics and Applications - Singapore, Singapore (Monday 26 November 2001)] Photonic Systems and Applications - Photoelastic modulation polarimetry and its measurement of twisted nematic liquid crystal

Chao, Yu-Faye, Lin, Andrew, Wang, M. W., Sidorin, Yakov S., Tang, Ding Y.

Année:

2001

Langue:

english

Fichier:

PDF, 223 KB

english, 2001

19

SPIE Proceedings [SPIE IC02 - Quebec City, Canada (Sunday 2 June 2002)] Applications of Photonic Technology 5 - The intensity ratio alignment technique in photoelastic modulation ellipsometry and polarimetry

Chao, Yu-Faye, Lessard, Roger A., Lampropoulos, George A., Schinn, Gregory W.

Année:

2003

Langue:

english

Fichier:

PDF, 178 KB

english, 2003

20

SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Polarization Analysis and Measurement II - Ellipsometric measurements on SiO2 by intensity ratio technique

Chao, Yu-Faye, Wei, C. S., Lee, Wei-Te, Lin, Shy C., Chao, Tien S., Goldstein, Dennis H., Chenault, David B.

Année:

1994

Langue:

english

Fichier:

PDF, 612 KB

english, 1994

21

SPIE Proceedings [SPIE ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging - Beijing, China (Tuesday 25 June 2013)] International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications - Developing a phase and intensity measurement technique with multiple incident angles under surface plasmon resonance condition

Han, Chien-Yuan, Du, Cheng You, Chen, Yi-Ren, Chao, Yu-Faye, Amzajerdian, Farzin, Aksnes, Astrid, Chen, Weibiao, Gao, Chunqing, Zheng, Yongchao, Wang, Cheng

Année:

2013

Langue:

english

Fichier:

PDF, 366 KB

english, 2013

22

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Reflection, Scattering, and Diffraction from Surfaces - Determining thickness of films on a curved substrate by use of ellipsometric measurement

Gu, Zu-Han, Han, Chien-Yuan, Lee, Zhen-You, Hanssen, Leonard M., Chao, Yu-Faye

Année:

2008

Langue:

english

Fichier:

PDF, 605 KB

english, 2008